The SR400 Dual-Channel Gated Photon Counter offers a convenient, integrated approach to photon counting that avoids the complexity and expense of older counting systems. No longer is it necessary to mix and match amplifiers, discriminators, gate generators and counters. The SR400 combines all these modules into a single, integrated, microprocessor controlled instrument. Complex measurement tasks such as background subtraction, synchronous detection, source compensation and pile-up correction can all be performed easily with the SR400.
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技术参数: |
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Signal Inputs |
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Bandwidth |
DC to 300 MHz |
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Input impedance |
50 Ω |
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Linear range |
±300 mV (at input) |
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Input protection |
±5 VDC, 50 V for 1 µs |
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Overload recovery |
5 ns |
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Discriminators |
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Counters A, B, and T have independent discriminators when counting the signal inputs. All discriminator levels may be set to a fixed level or scanned. |
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Discriminator range |
-300 mV to +300 mV |
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Discriminator slope |
Rising or falling |
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Resolution |
0.2 mV |
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Input offset voltage |
<1 mV |
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Minimum pulse input |
10 mV |
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Pulse-pair resolution |
5 ns |
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DISC outputs |
NIM levels into 50 Ω |
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Inhibit input |
TTL high stops count |
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Trigger Input |
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Impedance |
10 kΩ |
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Threshold |
±2.000 VDC in 1 mV steps |
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Slope |
Rising or falling |
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Protection |
15 VDC, 100 V for 1 µs |
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Gate Generators |
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Both the A and B gates may be fixed in time or scanned. The gate outputs show the positions of the gates with respect to the discriminator outputs. |
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Insertion delay |
25 ns |
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Maximum delay |
999.2 ms |
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Minimum gate width |
5 ns |
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Maximum gate width |
999 ms or CW |
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Resolution |
0.1 %, 1 ns minimum |
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Accuracy |
2 ns + 1 % |
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Jitter |
200 ps rms +100 ppm |
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Maximum trigger rate |
1 MHz |
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GATE view output |
NIM levels into 50 Ω |
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GATE view error |
<2 ns |
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Scan and Dwell |
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The number of count periods or data points in a scan may be set from 1 to 2000. The duration of one count period is determined by the preset condition.
The time between consecutive count periods is the dwell time and can be set from 2 ms to 60 s. The dwell output will be TTL high during the dwell time. This output can be used to trigger external devices. At the end of a scan (of 1 to 2000 count periods), counting may be programmed to stop or start the scan over again. The start key begins the first count period of the programmed scan.
The stop key terminates the current count period and pauses the scan. If scanning, gates and disc levels are held at their current values. Pressing the stop key while in a paused condition will reset the scan, and all scanned parameters will return to their start values. Pressing the start key while paused resumes the scan by starting the next count period.
The dwell time may also be set to external. In this mode, count periods begin with the start key or external start input (TTL rising edge). Count periods terminate with the preset condition, the stop key, or the external stop input (TTL rising edge). Pressing the stop key while not counting resets the scan.
All count data is internally buffered for one scan. Data may be read over the computer interfaces during or after a scan. |
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Display Mode |
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Continuous |
Displays current counter value |
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Hold |
Displays final count value |
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D/A Output |
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The front-panel D/A output is proportional (linear or log) to A, B, A-B or A+B, and is updated at the end of each count period. There are two rear-panel D/A outputs: port 1 and port 2. These outputs may be set or scanned from the front panel or via the computer interface. |
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Full scale |
±10 VDC |
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Resolution |
12 bits (5 mV) |
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Current rating |
10 mA |
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Output impedance |
<1 Ω |
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Accuracy |
0.1 % + 5 mV |
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General |
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Interfaces |
GPIB and RS-232 |
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Dimensions |
16' × 3.5' ×13' (WHL) |
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Weight |
10 lbs. |
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Power |
35 W, 100/120/220/240 VAC, 50/60 Hz |
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Warranty |
One year parts and labor on defects in materials and wor |
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